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A New Concept in Semiconductor Material/Device Characterization that Combines the Benefits of Both DC and AC Sourcing and Measuring

live date:4/1/2021

Duration:45 minutes


Traditionally, material/device characterization applications have required a combination of specialized DC and AC instruments – often resulting in complicated setups that also require highly skilled operators to integrate and operate equipment of mixed brands, computer interfaces, and types. Such setups often employ long cables between instruments and the sample, and as channel counts increase, so do the challenges of minimizing system noise and ensuring channel-to-channel timing and reference frequency synchronization. 

This webinar will explore a new approach: the use of a highly synchronized, AC + DC sourcing and measurement system that utilizes remote analog modules for optimum sensitivity and noise rejection to accurately characterize samples. The instrument architecture for directing low-level measurements from DC to 100 kHz ensures inherently synchronized data from 1 to 3 measurement channels which can be coordinated with up to 3 source channels or an external reference signal. In this way, this novel platform is highly adaptable for a range of R&D applications, including photosensor development, novel photovoltaic material characterization, and low-noise transistor measurements. 

Attend this webinar to learn how the architecture:

  • Eliminates the need for mixed instrument setups by combining the capabilities of DC picoammeters, voltmeters, and AC lock-in amplifiers
  • Minimizes the length of signal cables, which in turn minimizes cabling parasitics (leakage, noise, resistance, and reactance)
  • Uses a unique real-time sampling technology to ensure synchronous sourcing and measuring across multiple channels
  • Uses a single and simple touchscreen user interface that allows for easier setup and reconfiguration of a material/device characterization application.

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Speakers

David Daughton, PhD

Applications Scientist

Lake Shore Cryotronics

Dr. David Daughton is an Applications Scientist with Lake Shore Cryotronics focused on characterizing electronic materials and devices. He received his BS and MS in Physics from the University of Delaware and his PhD in Physics from The Ohio State University. Much of his work at OSU involved studying scanning tunneling microscopy and optical characterization of organic thin films at cryogenic temperatures. Since joining Lake Shore in 2011, Dr. Daughton has been the company’s principal investigator for a variety of product development projects, including recent work involving the development of a unique instrument architecture designed to provide synchronous DC, AC, and mixed DC+AC source and measure capabilities for low-level measurements. He also works extensively with Lake Shore’s line of cryogenic probe stations helping customers to configure existing Lake Shore products for specific measurements, as well as providing development support for new wafer-level characterization capabilities.

Houston Fortney

Development Engineer

Lake Shore Cryotronics

Houston Fortney, a Development Engineer with Lake Shore Cryotronics, received his BS in Electrical Engineering from Purdue University and has been with the company since 2015. In his time with Lake Shore, he has contributed to projects relating to vibrating sample magnetometer (VSM), temperature instrument, and magnetic measurement instrument development. Primarily, he is responsible for analog circuit design, modeling and optimization, firmware development and digital signal processing, as well as project leadership. Most recently, he has been involved with the development of innovative synchronous source and measure system for low-level material/device characterization. Houston enjoys visiting with customers to understand their needs and aid in the development of innovative solutions to their challenges.
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