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Live Date:6/17/2021
Duration:60 minutes
JEOL USA is pleased to welcome Dan Masiel (IDES Inc.) and Khalid Hattar (Sandia National Laboratories) to a virtual panel discussion focusing on the exciting technologies enabled with the latest in IDES products. IDES Inc., known as a pioneer in the time-resolved TEM space, was recently acquired by JEOL Ltd. making this technology exclusive to JEOL Instruments. New hardware and software products will be presented as an avenue to expand microscope flexibility and functionality in terms of speed, beam damage mitigation, and optical illumination.
Key learning objectives:
- DTEM - IDES technology can be right for analytical microscopists of all levels of expertise
- Which IDES products are best for your applications in materials science and life sciences
- Retrofitting your current TEM - requirements and advantages
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Speakers
 Daniel Masiel, PhD Founder and CEO Integrated Dynamic Electron Solutions (IDES) Daniel Masiel founded Integrated Dynamic Electron Solutions (IDES) in 2009 with the goal of enabling researchers to observe the behavior of nanomaterials at the fastest timescales possible. He has continued in his role as CEO after the acquisition of IDES by JEOL Ltd. in 2020. He received his B.S. and Ph.D. in Chemistry from the University of California, Davis and has focused his career on the development and commercialization of electron beam instrumentation, photonics, and software.  Khalid Hattar, PhD Scientist, Technical Staff Sandia National Laboratories Khalid Hattar is a Principal Member of the Technical Staff and scientist at Sandia National Laboratories and the Center for Integrated Nanotechnologies. He received a B.S. in Chemical Engineering from University of California, Santa Barbara and a Ph.D. in Materials Science and Engineering from University of Illinois, Urbana-Champaign in 2009. He specializes in determining the property-microstructure relationship for a variety of structural, electrical, and optical materials through in-situ TEM in various extreme environments, as well as tailoring local properties of materials through ion beam modification.  Patrick Phillips, PhD Asst. TEM Product Manager, Electron Microscopy JEOL USA Dr. Phillips received his PhD in Materials Science and Engineering in 2012 from the Ohio State University. Following an appointment as a Research Assistant Professor at the University of Illinois – Chicago, he joined JEOL USA in 2016. Previous research projects and current interests include Cs-Corrected STEM/EELS/EDS of metals, battery materials, oxides, and 2D structures
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